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LV+

–Versatile layout visualization platform, with the best performance

•Standard formats: GDS, OASIS, LEF/EDF, OpenAccess..

•Mask formats: MEBES, JEOL, HL, TOSHIBA(VSB-11,12)

–Powerful node tracing functions: space/width checking, double via checking..

–DRC/DFM error listing/checking

–Data cutting out, XOR, sizing…..logical operation

–Many unique features: cross section, 3DV, density, even simple editing ….

OASIS Utility

–GDS/OASIS converter and format checker/linter

RSCalc

–High-speed resistance calculation / analysis

–GDS/OASIS input only

 

 

 

 

 

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