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LV+

–   Versatile layout visualization platform, with the best performance

•  Standard formats: GDS, OASIS, Jobdeck, LEF / EDF

•  Mask formats: MEBES, JEOL, HL, TOSHIBA (VSB-11,12)

–   Powerful node tracing functions: space/width checking, double via checking..

–   Layout to Schematic

–   DRC / DFM error listing / checking

–   Easy-to-use pattern matching function

   Interface with Synopsys ICV, Mentor Calibre,
Hamamatsu……

–   Abundant features, such as cross section, 3DV, density, simple editing, logical operation…..

OASIS Utility

–   GDS/OASIS converter and format checker/linter

RSCalc

 

 

 

 

 

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